Electrostatic Force Spectroscopy of Localized States. Application to single electron charging of individual quantum dots

Electrostatic Force Spectroscopy of Localized States. Application to single electron charging of individual quantum dots
Год
 
Страниц
 
128
ISBN
 
9783639238860
Издатель
 
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Описание:

Nanotechnology continues to develop novel materials and devices that can potentially improve our daily life. Atomic force microscopy (AFM) has proven to be one of the most powerful characterization tools at the nanoscale. Variants of atomic force...

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