Optical metrology

Optical metrology
Автор
 
Год
 
Страниц
 
359
ISBN
 
ISBN10:0470843004;ISBN10:0470843004
Издатель
 
Wiley

Описание:

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
* End-of-chapter problems.

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