System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)

System-on-Chip Test Architectures: Nanometer  Design for Testability (Systems on Silicon)
Автор
 
Год
 
Страниц
 
896
ISBN
 
ISBN10:012373973X;ISBN10:1865843830;ISBN13:9780123739735;ISBN13:0708091054321
Издатель
 
Morgan Kaufmann

Описание:

This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by L.T. Wang.
You get the most complete and up-to-date summary of DfT methodes and techniques. I am using the book at work and for teaching students at the University. For teaching you are granted access to training material and ATPG software to use with students for free.

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